Experimental determination of electron effective attenuation lengths in silicon dioxide thin films using synchrotron radiation II. Effects of elastic scattering

2000 ◽  
Vol 29 (5) ◽  
pp. 336-340 ◽  
Author(s):  
H. Shimada ◽  
N. Matsubayashi ◽  
M. Imamura ◽  
M. Suzuki ◽  
Y. Higashi ◽  
...  
Keyword(s):  
Thin Films ◽  
Elastic Scattering ◽  
Synchrotron Radiation ◽  
Silicon Dioxide ◽  
Experimental Determination

scholarly journals Experimental Determination of Complex Optical Constants of Air‐Stable Inorganic CsPbI 3 Perovskite Thin Films

2020 ◽  
Vol 14 (6) ◽  
pp. 2000070 ◽  
Author(s):  
Wensheng Yan ◽  
Yi Guo ◽  
Deski Beri ◽  
Stephan Dottermusch ◽  
Haining Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Experimental Determination ◽  
Optical Constants

Experimental determination of the upper critical field of epitaxially grown thin films of YBa2Cu3O7−δdown to He temperature

1991 ◽  
Vol 70 (4) ◽  
pp. 2230-2233 ◽  
Author(s):  
R. Wördenweber ◽  
M. O. Abd‐El‐Hamed ◽  
J. Schneider ◽  
O. Laborde
Keyword(s):  
Thin Films ◽  
Experimental Determination ◽  
Critical Field ◽  
Upper Critical Field

scholarly journals Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters

2018 ◽  
Vol 33 (6) ◽  
pp. 1003-1013 ◽  
Author(s):  
Rainer Unterumsberger ◽  
Philipp Hönicke ◽  
Julien L. Colaux ◽  
Chris Jeynes ◽  
Malte Wansleben ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Experimental Determination ◽  
Fluorescence Yield ◽  
X Ray ◽  
Fundamental Parameters

The fluorescence yield of the K- and L3-shell of gallium was determined using the radiometrically calibrated (reference-free) X-ray fluorescence instrumentation at the BESSY II synchrotron radiation facility.

scholarly journals RESONANT MAGNETIC SCATTERING OF POLARIZED SOFT X-RAYS

2000 ◽  
Vol 07 (01n02) ◽  
pp. 175-189 ◽  
Author(s):  
MAURIZIO SACCHI
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Elastic Scattering ◽  
Synchrotron Radiation ◽  
Energy Range ◽  
Magnetic Scattering ◽  
X Rays ◽  
X Ray ◽  
Magnetic Devices ◽  
Recent Extension

Resonant elastic scattering of polarized X-rays is a powerful technique for the study of the magnetic properties of solids. Its recent extension to the soft X-ray energy range has been driven by applications in the field of artificially structured magnetic devices, like multilayers and superlattices. This article reviews recent elastic scattering experiments using synchrotron radiation, performed at the 2p core resonances of transition metals in solids, thin films and ordered multilayers.

Experimental determination of electronic stopping for ions in silicon dioxide

2005 ◽  
Vol 87 (10) ◽  
pp. 104103 ◽  
Author(s):  
Y. Zhang ◽  
W. J. Weber ◽  
D. E. McCready ◽  
D. A. Grove ◽  
J. Jensen ◽  
...  
Keyword(s):  
Silicon Dioxide ◽  
Experimental Determination

Experimental determination of kinetic parameters for crystallizing amorphous NiTi thin films

2005 ◽  
Vol 87 (11) ◽  
pp. 114102 ◽  
Author(s):  
Hoo-Jeong Lee ◽  
Hai Ni ◽  
David T. Wu ◽  
Ainissa G. Ramirez
Keyword(s):  
Thin Films ◽  
Experimental Determination ◽  
Kinetic Parameters
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